The ALBA spectroscopic LEEM-PEEM experimental station: layout and performance

LEEM and UHV-PEEM: a retrospective.

The evolution of LEEM and the later extension to spectroscopic PEEM, which run more or less parallel to Gertrude F. Rempfer's involvement in UV-PEEM and LEEM, are recounted with emphasis on instrumentation.

Low-energy electron microscopy and spectroscopy with ESCHER: Status and prospects

We describe the layout and the capabilities of a new aberration-corrected low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) facility, which features realand reciprocal-space spectroscopy. This new setup, named Electronic, Structural, and Chemical Nanoimaging in Real Time (ESCHER), was recently installed at Leiden University. It has three major instrumentation-re...

Preface: Cathode Lens Microscopy for Nanoscience

This issue of the IBM Journal of Research and Development describes several recent advances in the field of nanoscience, with an emphasis on cathode-lens-based microscopy methods, including low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM). Also discussed are related analytical approaches such as low-energy electron diffraction (LEED), thermionic electron emissi...

Magnetic imaging by LEEM, X-PEEM, X-ray microscopy, and X-ray holography

Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM

This issue of the IBM journal describes recent advances in the field of nanoscience, with an emphasis on cathode lens-based microscopy methods, including LEEM (low-energy electron microscopy), PEEM (photoemission electron microscopy), and other related analytical approaches. Papers highlight scientific advances and instrumental developments on topics that include thin films, organic films, surf...